Publicaciones en la fuente ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2013 (EMAG2013)

Tipo Año Título Fuente
Ponencia2014A dissociation mechanism for the [a plus c] dislocation in GaNELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2013 (EMAG2013)
Ponencia2014Characterisation of Defects at Non-Polar GaN/InGaN Junctions in Novel Materials for Application in Light Emitting DiodesELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2013 (EMAG2013)
Ponencia2014Observation of depth-dependent atomic displacements related to dislocations in GaN by optical sectioning in the STEMELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2013 (EMAG2013)