Ver Publicación - Prisma - Unidad de Bibliometría

X-ray source downscaling enabled by combining microfabricated electrodes with carbon nanotube cold electron emitters

Kottler, Christian ; Longtin, Rémi; Giudice, Sandra; Jose-James, Rony; Niedermann, Philippe; Neels, Antonia; Kaufmann, Rolf; Sanchez-Valencia, Juan Ramon; Elsener, Hans Rudolf; Gröning, Oliver; Leinenbach, Christian; Gröning, Pierangelo; Dommann, Alex

Tipo: Artículo
Año de Publicación: 2014
Volumen: 122
Páginas: 13 - 19
Fuente Nº Citas Fecha Actualización
scopus1220-04-2024
wos1220-04-2024
Dimensions
PlumX
Altmetric

Año: 2014

Journal Impact Factor (JIF): 1,197

CategoríaEdiciónPosiciónCuartilTercilDecil
ENGINEERING, ELECTRICAL & ELECTRONICSCIE129/249Q3T2D6
OPTICSSCIE54/87Q3T2D7
PHYSICS, APPLIEDSCIE94/144Q3T2D7
NANOSCIENCE & NANOTECHNOLOGYSCIE62/80Q4T3D8

Año: 2017

Journal Citation Indicator (JCI): 0,540

CategoríaPosiciónCuartilTercilDecilPercentil
ENGINEERING, ELECTRICAL & ELECTRONIC165/306Q3T2D646,24
NANOSCIENCE & NANOTECHNOLOGY60/116Q3T2D648,71
OPTICS54/106Q3T2D649,53
PHYSICS, APPLIED73/165Q2T2D556,06

Año:

2014

CiteScore:

2,900

CategoríaPosiciónCuartilTercilDecil
Electrical and Electronic Engineering157/651Q1T1D3
Surfaces, Coatings and Films29/101Q2T1D3
Atomic and Molecular Physics, and Optics51/157Q2T1D4
Condensed Matter Physics136/395Q2T2D4
Electronic, Optical and Magnetic Materials71/207Q2T2D4

SJR año:

2014

Factor de Impacto:

0,586

CategoríaPosiciónCuartilTercilDecil
Electrical and Electronic Engineering179/629Q2T1D3
Surfaces, Coatings and Films32/104Q2T1D4
Atomic and Molecular Physics, and Optics70/160Q2T2D5
Condensed Matter Physics166/395Q2T2D5
Electronic, Optical and Magnetic Materials80/193Q2T2D5
Nanoscience and Nanotechnology44/91Q2T2D5
No existen datos para la revista de esta publicación.
Agencia Código de Proyecto
Swiss federal program Nano-Tera (nanotera.ch) through "NEXRAY"-
Nota: los datos sobre financiación provienen de la WOS
# Autor Afiliación
1Kottler, Christian Centre Suisse d'Electronique et de Microtechnique SA (Switzerland)
2Longtin, RémiEmpa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland)
3Giudice, SandraCentre Suisse d'Electronique et Microtechnique SA (Switzerland)
4Jose-James, RonyCentre Suisse d'Electronique et Microtechnique SA (Switzerland)
5Niedermann, PhilippeCentre Suisse d'Electronique et de Microtechnique SA (Switzerland)
6Neels, AntoniaCentre Suisse d'Electronique et de Microtechnique SA (Switzerland)
7Kaufmann, RolfCentre Suisse d'Electronique et de Microtechnique SA (Switzerland)
8Sanchez-Valencia, Juan RamonEmpa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland)
9Elsener, Hans RudolfEmpa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland)
10Gröning, OliverEmpa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland)
11Leinenbach, ChristianEmpa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland)
12Gröning, PierangeloEmpa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland)
13Dommann, AlexEmpa - Swiss Federal Laboratories for Materials Science and Technology (Switzerland)