Año: 2006
Journal Impact Factor (JIF): 2,331
| Categoría | Edición | Posición | Cuartil | Tercil | Decil |
|---|---|---|---|---|---|
| INSTRUMENTS & INSTRUMENTATION | SCIE | 5/53 | Q1 | T1 | D1 |
| CHEMISTRY, ANALYTICAL | SCIE | 22/68 | Q2 | T1 | D4 |
| ELECTROCHEMISTRY | SCIE | 8/22 | Q2 | T2 | D4 |
Año: 2017
Journal Citation Indicator (JCI): 1,770
| Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
|---|---|---|---|---|---|
| CHEMISTRY, ANALYTICAL | 6/93 | Q1 | T1 | D1 | 94,09 |
| ELECTROCHEMISTRY | 3/36 | Q1 | T1 | D1 | 93,06 |
| INSTRUMENTS & INSTRUMENTATION | 3/69 | Q1 | T1 | D1 | 96,38 |
Año:
2011
CiteScore:
6,000
| Categoría | Posición | Cuartil | Tercil | Decil |
|---|---|---|---|---|
| Condensed Matter Physics | 25/383 | Q1 | T1 | D1 |
| Electrical and Electronic Engineering | 35/589 | Q1 | T1 | D1 |
| Electronic, Optical and Magnetic Materials | 17/183 | Q1 | T1 | D1 |
| Instrumentation | 2/90 | Q1 | T1 | D1 |
| Materials Chemistry | 13/233 | Q1 | T1 | D1 |
| Metals and Alloys | 5/126 | Q1 | T1 | D1 |
| Surfaces, Coatings and Films | 7/91 | Q1 | T1 | D1 |
SJR año:
2006
Factor de Impacto:
1,359
| Categoría | Posición | Cuartil | Tercil | Decil |
|---|---|---|---|---|
| Electrical and Electronic Engineering | 46/527 | Q1 | T1 | D1 |
| Instrumentation | 5/74 | Q1 | T1 | D1 |
| Materials Chemistry | 21/242 | Q1 | T1 | D1 |
| Metals and Alloys | 10/162 | Q1 | T1 | D1 |
| Surfaces, Coatings and Films | 9/104 | Q1 | T1 | D1 |
| Condensed Matter Physics | 55/371 | Q1 | T1 | D2 |
| Electronic, Optical and Magnetic Materials | 22/155 | Q1 | T1 | D2 |
| # | Autor | Afiliación |
|---|---|---|
| 1 | Lechuga, L. M. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 2 | Tamayo, J. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 3 | Álvarez, M. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 4 | Carrascosa, L. G. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 5 | Yufera, A. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 6 | Doldán, R. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 7 | Peralías, E. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 8 | Rueda, A. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 9 | Plaza, J. A. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 10 | Zinoviev, K. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 11 | Domínguez, C. | CSIC - Instituto de Microelectronica de Barcelona (IMB-CNM) (Spain) |
| 12 | Zaballos, A. | CSIC - Centro Nacional de Biotecnologia (CNB) (Spain) |
| 13 | Moreno, M. | CSIC - Centro Nacional de Biotecnologia (CNB) (Spain) |
| 14 | Martínez-A, C. | CSIC - Centro Nacional de Biotecnologia (CNB) (Spain) |
| 15 | Wenn, D. | University of Southampton (United Kingdom) |
| 16 | Harris, N. | University of Southampton (United Kingdom) |
| 17 | Bringer, C. | Laboratoire d'Analyse et d'Architecture des Systemes (France) |
| 18 | Bardinal, V. | Laboratoire d'Analyse et d'Architecture des Systemes (France) |
| 19 | Camps, T. | Laboratoire d'Analyse et d'Architecture des Systemes (France) |
| 20 | Vergnenègre, C. | Laboratoire d'Analyse et d'Architecture des Systemes (France) |
| 21 | Fontaine, C. | Laboratoire d'Analyse et d'Architecture des Systemes (France) |
| 22 | Díaz, V. | Genetrix (Spain) |
| 23 | Bernad, A. | Genetrix (Spain) |
