Diego Vázquez García de la Vega

Profesor Titular de Universidad
dvazquez@us.es
Área de conocimiento: Electrónica
Departamento: Electrónica y Electromagnetismo
Grupo: DISEÑO Y TEST DE CIRCUITOS INTEGRADOS DE SEÑAL MIXTA (TIC-178)
Prog. doctorado: Programa de Doctorado en Ciencias y Tecnologías Físicas (RD. 99/2011)
Tipo Año Título Fuente
Artículo2016 A Proposal for Yield Improvement with Power Tradeoffs in CMOS LNAs IEEE LATIN AMERICA TRANSACTIONS
Artículo2016 Design of an Energy-Efficient ZigBee Transceiver MIXED-SIGNAL CIRCUITS
Artículo2016 Energy-Aware Low-Power CMOS LNA with Process-Variations Management ACTIVE AND PASSIVE ELECTRONIC COMPONENTS
Artículo2016 Variability-aware design of integrated low-noise amplifiers Ingenieria Electronica, Automatica y Comunicaciones
Artículo2015 Constraints imposed by passive elements in the design of CMOS low-noise amplifiers Ingenieria Electronica, Automatica y Comunicaciones
Artículo2015 On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
Ponencia2013 Analysis of process variations' impact on a 2.4 GHz 90 nm CMOS LNA 2013 IEEE 4TH LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS)
Ponencia2013 Sinusoidal Signal Generation for Mixed-Signal BIST Using a Harmonic-Cancellation Technique 2013 IEEE 4TH LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS)
Ponencia2011 2.4-GHz single-ended input low-power low-voltage active front-end for ZigBee applications in 90 nm CMOS 2011 20th European Conference on Circuit Theory and Design, ECCTD 2011
Ponencia2011 A 3.6mW @ 1.2V high linear 8th-order CMOS complex filter for IEEE 802.15.4 standard European Solid-State Circuits Conference
Artículo2011 Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Artículo2010 A BIST Solution for Frequency Domain Characterization of Analog Circuits JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Ponencia2010 A Low Power Low Voltage Mixer for 2.4GHz Applications in CMOS-90nm Technology PROCEEDINGS OF THE 13TH IEEE SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS
Artículo2010 Aisladores Ex-i de sólo 12,5 mm de ancho Automática e Instrumentación
Ponencia2010 Guidelines for the efficient design of sinewave generators for analog/mixed-signal BIST Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010
Ponencia2010 Low-cost signature test of RF blocks based on envelope response analysis 2010 15th IEEE European Test Symposium, ETS'10
Artículo2010 On-chip characterisation of RF systems based on envelope response analysis ELECTRONICS LETTERS
Ponencia2009 A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis 2009 ASIAN TEST SYMPOSIUM, PROCEEDINGS
Ponencia2009 Complex filter for ZigBee, in CMOS ST90nm Proceedings of the Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009
Ponencia2009 Efficient Functional Built-In Test for RF Systems Using Two-Tone Response Envelope Analysis 2009 AFRICON, VOLS 1 AND 2
Ponencia2009 Practical Test Cores for the On-Chip Generation and Evaluation of Analog Test Signals: Application to a Network/Spectrum Analyzer for Analog BIST PRIME: PROCEEDINGS OF THE CONFERENCE 2009 PHD RESEARCH IN MICROELECTRONICS AND ELECTRONICS
Ponencia2008 A 1.2V 5.14mW Quadrature Frequency Synthesizer in 90nm CMOS Technology for 2.4GHz ZigBee Applications 2008 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2008), VOLS 1-4
Ponencia2008 A 2.4GHz LNA in a 90-nm CMOS Technology Designed with ACM Model SBCCI 2008: 21ST SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEMS DESIGN, PROCEEDINGS
Ponencia2008 A 2.5MHz bandpass active complex filter With 2.4MHz bandwidth for wireless communications 23rd Conference on Design of Circuits and Integrated Systems (2008)
Ponencia2008 Practical implementation of a network analyzer for analog BIST applications Design Automation and Test in Europe Conference and Exhibition
Ponencia2006 A sinewave Analyzer for mixed-signal BIST applications in a 0.35 mu m technology PROCEEDINGS OF THE 2006 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS
Ponencia2006 On-chip analog sinewave generator with reduced circuitry resources IEEE MWSCAS'06: PROCEEDINGS OF THE 2006 49TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL II
Artículo2005 A low-cost digital frequency testing approach for mixed-signal devices using sigma-delta modulation MICROELECTRONICS JOURNAL
Artículo2005 Sine-wave signal characterization using square-wave and Sigma Delta-modulation: Application to mixed-signal BIST JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Artículo2005 Test of switched-capacitor ladder filters using OBT MICROELECTRONICS JOURNAL
Ponencia2004 Method for parameter extraction of analog sine-wave signals for mixed-signal built-in-self-test applications DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS
Ponencia2003 A LP-LV high performance monolitic DTMF receiver with on-chip test facilities VLSI CIRCUITS AND SYSTEMS
Artículo2003 A switched opamp-based bandpass filter: Design and implementation in a 0.35 mu m CMOS technology ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
Artículo2003 Oscillation-based test in bandpass oversampled A/D converters MICROELECTRONICS JOURNAL
Artículo2002 A simple and secure start-up circuitry for oscillation-based-test application ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
Ponencia2002 Design of a switched opamp-based bandpass filter in a 0.35 mu m CMOS technology ICES 2002: 9TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS I-111, CONFERENCE PROCEEDINGS
Artículo2002 On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
Artículo2002 Oscillation-based test in oversampled Sigma Delta modulators MICROELECTRONICS JOURNAL
Ponencia2002 Practical oscillation-based test in analog integrated filters: Experimental results FIRST IEEE INTERNATION WORKSHOP ON ELECTRONIC DESIGN, TEST AND APPLICATIONS, PROCEEDINGS
Artículo2002 Practical oscillation-based test of integrated filters IEEE DESIGN & TEST OF COMPUTERS
Ponencia2002 Practical solutions for the application of the oscillation-based-test in analog integrated circuits 2002 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I, PROCEEDINGS
Ponencia2002 Practical solutions for the application of the oscillation-based-test: Start-up and on-chip evaluation 20TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS
Artículo2002 Testing mixed-signal cores: A practical oscillation-based test in an analog macrocell IEEE DESIGN & TEST OF COMPUTERS
Ponencia2001 A low-voltage low-power high performance fully integrated DTMF receiver European Solid-State Circuits Conference
Ponencia2001 Design of a CMOS fully differential switched-opamp for SC circuits at very low power supply voltages ICECS 2001: 8TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS I-III, CONFERENCE PROCEEDINGS
Ponencia2000 Built-in self-test in mixed-signal ICs: a DTMF macrocell Proceedings of the IEEE International Conference on VLSI Design
Ponencia2000 Testing mixed-signal cores 13TH SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEMS DESIGN, PROCEEDINGS
Ponencia2000 Testing mixed-signal cores: Practical Oscillation-based Test in an analog macrocell PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000)
Ponencia1999 Effective oscillation-based test for application to a DTMF filter bank IEEE International Test Conference (TC)
Artículo1998 A high-Q bandpass fully differential SC filter with enhanced testability IEEE JOURNAL OF SOLID-STATE CIRCUITS
Ponencia1998 Switch-level fault coverage analysis for switched-capacitor systems DESIGN, AUTOMATION AND TEST IN EUROPE, PROCEEDINGS
Ponencia1996 Reducing the impact of DFT on the performance of analog integrated circuits: Improved sw-opamp design 14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS
Artículo1995 Practical DfT strategy for fault diagnosis inactive analogue filters ELECTRONICS LETTERS
Ponencia1995 Solution for the on-line test of analog ladder filters Proceedings of the IEEE VLSI Test Symposium
Artículo1994 Diseño para testabilidad de estructuras bicuadráticas Actas del IX Congreso de Diseño de Circuitos Integrados, 9, 10 y 11 de noviembre de 1994, Maspalomas, Gran Canaria
Ponencia1994 Low-cost strategy for testing analog filters Proceedings - IEEE International Symposium on Circuits and Systems
Ponencia1994 New strategy for testing analog filters Proceedings of the IEEE VLSI Test Symposium
Artículo1993 Detección concurrente de error en filtros MOSFET-C VIII Congreso Diseño de Circuitos Integrados: Málaga, 9 al 11 de noviembre de 1993
Artículo1993 Improving the testability of switched-capacitor filters JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Ponencia1993 On-line error detection for continuous-time MOSFET-C filters European Solid-State Circuits Conference
Artículo1993 Testable Switched-Capacitor Filters IEEE JOURNAL OF SOLID-STATE CIRCUITS
Ponencia1992 CONCURRENT TESTING OF ANALOG FILTERS USING A PROGRAMMABLE BIQUAD 1992 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-6
Ponencia1992 DESIGN FOR TESTABILITY TECHNIQUES IN SWITCHED-CAPACITOR CIRCUITS PROCEEDINGS OF THE 35TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1 AND 2
Artículo1992 Estrategia de test On-Line para filtros SC VII Congreso de Diseño de Circuitos Integrados: 3, 4 y 5 de noviembre de 1992, Toledo, España : actas
Ponencia1992 On-line testing of switched-capacitor filters Proceedings of the IEEE VLSI Test Symposium
Ponencia1992 Testable switched-capacitor filters European Solid-State Circuits Conference
Ponencia1991 A practical implementation of fault-tolerant switched-capacitor circuits Proceedings - IEEE International Symposium on Circuits and Systems
Ponencia1991 Aplicación de estrategias de votado en circuitos analógicos SC Diseño de circuitos integrados: actas del VI Congreso, Santander, 11/15 de noviembre de 1991

Proyectos de Investigación

Fecha de inicio Fecha de fin Rol Denominación Agencia financiadora
01/03/2006 28/02/2009 Investigador/a Técnicas de diseño y test de circuitos integrados mixtos en tecnologías emergentes (EXC/2005/TIC-927) Junta de Andalucía (Plan Andaluz de Investigación) (Autonómico)
01/01/2019 30/09/2022 Responsable Asics de Alta Velocidad y Alta Tensión para Ambientes Extremos de Radiación y Temperatura (RTI2018-099825-B-C32) Ministerio de Ciencia, Innovación y Universidades (Nacional)
30/12/2016 29/09/2019 Responsable ASIC para Sensores de Irradiancia Solar Compactos (ESP2016-80320-C2-2-R) Ministerio de Economía y Competitividad (Nacional)
01/01/2012 31/12/2015 Investigador/a Adaptando el Diseño y Test de Circuitos Integrados de Señal Mixta y de Rf a las Variaciones del Proceso y del Entorno (TEC2011-28302) Ministerio de Ciencia e Innovación (Nacional)
15/01/1998 14/07/2001 Investigador/a ADVANCED SOLUTIONS IN TEST ENGINEERING RESEARCH FOR NEXT GENERATION INTEGRATED SYSTEMS (ESPRIT 26354)
03/02/2010 30/06/2014 Investigador/a Auto-Calibración y Auto-Test en Circuitos Analógicos, Mixtos y de Radio Frecuencia (P09-TIC-5386) Junta de Andalucía - Consejería de Innovación, Ciencia y Empresas (Autonómico)

Contratos

Fecha de inicio Fecha de fin Rol Denominación Agencia financiadora
27/09/2002 31/12/2002 Investigador/a Microelectrónica: tecnología, diseño y test (OG-036/03) Consejo Superior de Investigaciones Científicas (CSIC) (Nacional)
17/07/1998 31/12/1998 Investigador/a MICROELECTRÓNICA: TECNOLOGÍA, DISEÑO Y TEST (OG-007/99)
01/11/2006 01/02/2007 Responsable Diseño de bloques analógicos para un chip de visión (OG-145/06) Innovaciones Microelectrónicas S.L. (Local)
03/07/2001 31/12/2001 Investigador/a Microelectrónica: tecnología, diseño y test (SPRING-IST-1999-12342) (OG-023/02) Consejo Superior de Investigaciones Científicas (Nacional)
17/07/1998 31/12/1998 Investigador/a MICROELECTRÓNICA: TECNOLOGÍA, DISEÑO Y TEST (OG-006/99)
04/01/2005 31/03/2005 Investigador/a Microelectrónica: tecnología, diseño y test (OG-123/05) Consejo Superior de Investigaciones Científicas (CSIC) (Nacional)
17/07/1998 31/12/1998 Investigador/a MICROELECTRÓNICA: TECNOLOGÍA, DISEÑO Y TEST (OG-008/99)
22/07/2003 31/12/2003 Investigador/a Microelectrónica: tecnología, diseño y test (OG-079/04) Consejo Superior de Investigaciones Científicas (CSIC) (Nacional)
17/07/1998 31/12/1998 Investigador/a MICROELECTRÓNICA: TECNOLOGÍA, DISEÑO Y TEST (OG-005/99)
03/07/2001 31/12/2001 Investigador/a Microelectrónica: tecnología, diseño y test (ESPRIT 33485 - MICROCARD) (OG-022/02) Consejo Superior de Investigaciones Científicas (Nacional)
27/09/2002 31/12/2002 Investigador/a Microelectrónica: tecnología, diseño y test (OG-039/03) Consejo Superior de Investigaciones Científicas (CSIC) (Nacional)
03/07/2001 31/12/2001 Investigador/a Microelectrónica: tecnología, diseño y test (OG-020/02) Consejo Superior de Investigaciones Científicas (Nacional)