Año: 2022
Journal Impact Factor (JIF): 3.3
| Categoría | Edición | Posición | Cuartil | Tercil | Decil |
|---|---|---|---|---|---|
| OPTICS | SCIE | 37/100 | Q2 | T2 | D4 |
| ENGINEERING, ELECTRICAL & ELECTRONIC | SCIE | 114/275 | Q2 | T2 | D5 |
| IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY | SCIE | 14/28 | Q2 | T2 | D5 |
Año: 2022
Journal Citation Indicator (JCI): 0,670
| Categoría | Posición | Cuartil | Tercil | Decil | Percentil |
|---|---|---|---|---|---|
| ENGINEERING, ELECTRICAL & ELECTRONIC | 147/352 | Q2 | T2 | D5 | 58,38 |
| IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY | 12/32 | Q2 | T2 | D4 | 64,06 |
| OPTICS | 50/119 | Q2 | T2 | D5 | 58,40 |
Año:
2022
CiteScore:
4.800
| Categoría | Posición | Cuartil | Tercil | Decil |
|---|---|---|---|---|
| Electrical and Electronic Engineering | 242/738 | Q2 | T1 | D4 |
| Computer Vision and Pattern Recognition | 39/100 | Q2 | T2 | D4 |
| Electronic, Optical and Magnetic Materials | 102/271 | Q2 | T2 | D4 |
| Software | 167/404 | Q2 | T2 | D5 |
SJR año:
2022
Factor de Impacto:
0.591
| Categoría | Posición | Cuartil | Tercil | Decil |
|---|---|---|---|---|
| Computer Vision and Pattern Recognition | 36/93 | Q2 | T2 | D4 |
| Electrical and Electronic Engineering | 244/696 | Q2 | T2 | D4 |
| Electronic, Optical and Magnetic Materials | 90/251 | Q2 | T2 | D4 |
| Software | 169/377 | Q2 | T2 | D5 |